International Journal of Statistics and Management System
Editor-in-Chief:
- Miguel A. Arcones. Binghamton University, USA.
E-mail: arcones@math.binghamton.edu.
Empirical processes, asymptotics, large deviations.
Advisory Board:
- Evarist Gine. University of Connecticut, USA.
E-mail: gine@math.uconn.edu. Empirical processes, density estimation, bootstrap.
- Gabor Lugosi. Universidad Pompeu Fabra de Barcelona, Spain.
E-mail: lugosi@cs.mcgill.ca. Pattern classification.
- Pascal Massart. Université de Paris-Sud, France.
E-mail: Pascal.Massart@math.u-psud.fr. Empirical processes, concentration inequalities, nonparametric statistics
, model selection, statistical learning theory.
- Francisco Samaniego. University of California, Davis, USA.
E-mail: fjsamaniego@ucdavis.edu. Statistical modeling, Bayesian inference, reliability.
Associate Editors:
- S. Basu. Northern Illinois University, USA. E-mail: basu@niu.edu.
Bayesian Statistics, reliability.
- C. Borror. Arizona State University West, USA. E-mail: conni@asu.edu.
Experimental design, response surface methods, statistical process control.
- C. M. Crainiceanu. Johns Hopkins University, USA. E-mail:
ccrainic@jhsph.edu. Nonparametric, smoothing, measurement error,
likelihood ratio tests, Bayesian inference.
- J. A. Cuesta-Albertos. Universidad de Cantabria, Spain. E-mail:
cuestaj@unican.es. Goodness of fit tests, bootstrap, asymptotics.
- M. A. Delgado. Universidad Carlos III de Madrid, Spain. E-mail:
delgado@est-econ.uc3m.es. Time series, semiparametrics, nonparametrics.
- M.B.C Khoo, Universiti Sains Malaysia, Malaysia.
E-mail: mkbc@tm.net.my. Statistical process control, quality control,
reliability analysis.
- V. Lariccia. University of Delaware, USA.
E-mail: 20242@udel.edu. Nonparametric density estimation,
goodness of fit tests.
- A. Lijoi. Universita degli Studi di Pavia, Italy.
E-mail: lijoi@unipv.it. Nonparametric Bayesian statistics.
- W.--L. Loh. National University of Singapore, Republic of Singapore.
E-mail: stalohwl@nus.edu.sg. Classification theory, linear models.
- C. Matran. Universidad de Valladolid, Spain. E-mail:
matran@eio.uva.es. Robust statistics,
goodness of fit tests, bootstrap, asymptotics.
- Ø. Myrland. University of Tromsø. Norway.
E-mail: Oystein.Myrland@nfh.uit.no. Market research, price analysis,
economic impacts of generic advertising, models for consumer choice.
- B. U. Park. Seoul National University, Korea.
E-mail: bupark@stats.snu.ac.kr. Semiparametric models, function estimation.
- L. Peng. Georgia Institute of Technology, USA. E-mail:
peng@math.gatech.edu. Extreme value theory, heavy tailed distributions.
- A. Schick. Binghamton University, USA. E-mail: anton@math.binghamton.edu.
Semiparametric models, efficiency, density estimation.
- K. K. Suresh. Bharathiar University, India. Acceptance sampling, Statistical quality control,
agricultural statistics, econometrics, statistical expert systems. E-mail: sureshkk1@fastmail.fm.
- W. Wefelmeyer. University of Cologne, Germany. E-mail: wefelm@math.uni-koeln.de.
Asymptotics, efficiency, density estimation.
- Q. Yu. Binghamton University, USA. E--mail: qyu@math.binghamton.edu.
Survival analysis, decision theory.
- Y. Zuo. Michigan State University, USA. E--mail: zuo@stt.msu.edu.
Data Depth, robust statistics.
This file last modified on December 22, 2007.
Comments to
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